Ubwoko bwa SiC Imbuto Crystal Substrates Dia 205/203/208 4H-N Ubwoko bwitumanaho ryiza
Ibipimo bya tekiniki
Silicon karbide imbuto wafer | |
Polytype | 4H |
Ikosa ryerekana icyerekezo | 4 ° yerekeza kuri <11-20> ± 0.5º |
Kurwanya | Kumenyekanisha |
Diameter | 205 ± 0.5mm |
Umubyimba | 600 ± 50μm |
Ubugome | CMP, Ra≤0.2nm |
Ubucucike bwa Micropipe | ≤1 ea / cm2 |
Igishushanyo | ≤5, Uburebure bwose≤2 * Diameter |
Imipira / impande | Nta na kimwe |
Ikimenyetso cya laser imbere | Nta na kimwe |
Igishushanyo | ≤2, Uburebure bwose≤Ibipimo |
Imipira / impande | Nta na kimwe |
Agace ka polytype | Nta na kimwe |
Ikimenyetso cya laser inyuma | 1mm (uhereye hejuru) |
Impande | Chamfer |
Gupakira | Cassette ya Multi-Wafer |
Ibintu by'ingenzi biranga
1. Imiterere ya Crystal nuburyo bwo gukora amashanyarazi
· Crystallographic Stabilite: 100% 4H-SiC polytype yiganje, zeru zeru nyinshi (urugero, 6H / 15R), hamwe na XRD itigisa umurongo wuzuye ubugari kuri kimwe cya kabiri ntarengwa (FWHM) ≤32.7 arcsec.
· Umuvuduko mwinshi wa Carrier: Imashini ya elegitoronike ya cm 5.400 / V · s (4H-SiC) hamwe nu mwobo wa cm 380 cm / V · s, ituma ibishushanyo mbonera byihuta.
· Gukomera kw'imirasire: Ihanganira imirasire ya 1 ya MeV ya neutron hamwe no kwangirika kwimuka ya 1 × 10¹⁵ n / cm², nibyiza mu kirere no mu kirere.
2. Ibyiza byubushyuhe nubukanishi
· Ubushuhe budasanzwe bwubushyuhe: 4.9 W / cm · K (4H-SiC), inshuro eshatu za silikoni, ibikorwa bifasha hejuru ya 200 ° C.
· Coefficient yo Kwagura Ubushyuhe Buke: CTE ya 4.0 × 10⁻⁶ / K (25-1000 ° C), igahuza neza nububiko bushingiye kuri silikoni no kugabanya imihangayiko yubushyuhe.
3. Kugenzura neza no gutunganya neza
· Ubucucike bwa Micropipe: <0,3 cm⁻² (waferi ya santimetero 8), ubucucike bwa dislokisiyo <1000 cm⁻² (byagenzuwe hakoreshejwe KOH).
· Ubwiza bwubuso: CMP isizwe na Ra <0.2 nm, yujuje ibyangombwa bya EUV lithographie-ibyangombwa bisabwa.
Ibyingenzi
Indanganturo | Gusaba | Ibyiza bya tekiniki |
Itumanaho ryiza | Lazeri 100G / 400G, moderi ya silicon Photonics | InP imbuto yimbuto ituma bandgap itaziguye (1.34 eV) hamwe na Si-ishingiye kuri heteroepitaxy, bigabanya igihombo cyo guhuza optique. |
Imodoka nshya | 800V ihinduranya ingufu za inverteri, charger zo mu bwato (OBC) | 4H-SiC substrates ihangane> 1,200 V, igabanya igihombo cyogutwara 50% nubunini bwa sisitemu 40%. |
5G Itumanaho | Ibikoresho bya milimetero-RF RF (PA / LNA), ibyuma byongera ingufu za sitasiyo | Semi-insuline ya SiC substrates (résistivivite> 10⁵ Ω · cm) ituma imirongo myinshi (60 GHz +) ihuza pasiporo. |
Ibikoresho byo mu nganda | Ibyuma byubushyuhe bwo hejuru, impinduka zubu, monitor ya reaction ya nucleaire | InSb imbuto yimbuto (0.17 eV bandgap) itanga sensitivite igera kuri 300% @ 10 T. |
Ibyiza by'ingenzi
SiC (silicon carbide) imbuto ya kristal substrate itanga imikorere ntagereranywa hamwe na 4.9 W / cm · K itwara ubushyuhe bwumuriro, imbaraga zumuriro wa 2-4 MV / cm, hamwe na 3.2 eV mugari, bigatanga imbaraga nyinshi, inshuro nyinshi, hamwe nubushyuhe bwo hejuru. Kugaragaza ubucucike bwa micropipe zero na <1.000 cm⁻² ubwinshi bwa dislocation, izi substrate zemeza ko kwizerwa mubihe bikabije. Ubusembure bwimiti hamwe nubuso bwa CVD (Ra <0.2 nm) bishyigikira iterambere ryiterambere rya heteroepitaxial (urugero, SiC-kuri-Si) kuri optoelectronics na sisitemu ya power.
Serivisi za XKH:
1. Umusaruro wihariye
· Imiterere ya Wafer ihindagurika: waferi ya santimetero 2-12 zifite uruziga, urukiramende, cyangwa imiterere-karemano (± 0.01 mm kwihanganira).
Kugenzura Doping: Azote (N) na aluminiyumu (Al) ikoreshwa neza na CVD, igera kuri 10ivity kugeza 10⁶ Ω · cm.
2. Ikoranabuhanga rigezweho?
· Heteroepitaxy: SiC-kuri-Si (ihujwe n'imirongo ya silikoni 8 ya silicon) na SiC-kuri-Diamond (imiyoboro y'amashanyarazi> 2000 W / m · K).
· Kugabanya ubukana: Gutera hydrogène hamwe na annealing kugirango ugabanye micropipe / ubucucike, kuzamura umusaruro wafer kuri> 95%.
3. Sisitemu yo gucunga neza?
· Kwipimisha kurangira-kurangira: Raman spectroscopy (verisiyo ya polytype), XRD (kristu), na SEM (gusesengura inenge).
· Impamyabumenyi: Yubahiriza AEC-Q101 (imodoka), JEDEC (JEDEC-033), na MIL-PRF-38534 (urwego rwa gisirikare).
4. Inkunga yo gutanga amasoko ku isi yose?
· Ubushobozi bw'umusaruro: Ibisohoka buri kwezi> 10,000 wafer (60% 8-santimetero), hamwe no gutanga amasaha 48 byihutirwa.
· Logistique Network: Igipfukisho mu Burayi, Amerika y'Amajyaruguru, na Aziya-Pasifika ukoresheje ibicuruzwa byo mu kirere / inyanja hamwe n'ububiko bugenzurwa n'ubushyuhe.
5. Gutezimbere Tekinike?
· Laboratwari ihuriweho na R&D: Gufatanya kuri SiC power module ipakira neza (urugero, guhuza DBC substrate).
· Uruhushya rwa IP: Tanga GaN-kuri-SiC RF ikorana buhanga rya tekinoroji yo kugabanya ibiciro byabakiriya R&D.
Incamake
SiC (silicon carbide) imbuto ya kristal substrate, nkibikoresho byingenzi, irimo kuvugurura urunigi rw’inganda ku isi binyuze mu iterambere mu mikurire ya kristu, kugenzura inenge, no kwishyira hamwe. Mugukomeza guteza imbere kugabanya inenge ya wafer, kugabanya umusaruro wa santimetero 8, no kwagura urubuga rwa heteroepitaxial (urugero, SiC-kuri-Diamond), XKH itanga ibisubizo byizewe cyane, bidahenze kubisubizo bya optoelectronics, ingufu nshya, ninganda zateye imbere. Ibyo twiyemeje guhanga udushya bituma abakiriya bayobora kutabogama kwa karubone hamwe na sisitemu yubwenge, gutwara ibihe bizakurikiraho bigari-biggap semiconductor ecosystems.


